Focused Ion Beam (FIB): An Expert Insight The Focused Ion Beam (FIB) technology represents a breakthrough tool in precision imaging, patterning, and analysis, becoming an invaluable asset in fields such as materials science, semiconductor fabrication, and nanotechnology. Using a tightly focused beam of ions, typically gallium, FIB systems allow users to etch, mill, deposit, or analyze materials with extreme precision. This technique...
0 Compartilhamentos
600 Visualizações